Optical Properties of Te Thin Films Prepared by Thermal Evaporation Technique

  • Fatin G. Hachim Department of Physics-College of Science- University of Thi -Qar
Keywords: optical properties of Te films, effect of annealing on optical properties of Te films.

Abstract

This work describes, Tellurium (Te) films were deposited on glass substrates at room temperature by the method of vacuum evaporation with thickness (0.4μm), with rate of deposition equal to (5.5Å/sec), the samples are annealed in a vacuum for one hour at (373 and 433) K. The optical properties such as absorption coefficient () was determined using the absorbance and transmittance measurement from FTIR Shimadzu spectrophotometer, with range of wave length (2800-3900) nm. And also calculated optical constants (refractive index (n), extinction coefficient (k)) for Tellurium films. The tests have been shown that the optical energy gap increases with increasing of annealing temperature for the samples

Published
2019-07-10
How to Cite
Hachim, F. G. (2019). Optical Properties of Te Thin Films Prepared by Thermal Evaporation Technique. University of Thi-Qar Journal of Science, 4(4), 148-151. Retrieved from https://jsci.utq.edu.iq/index.php/main/article/view/684
Section
Articles