Study of Structural, Optical and Electrical Properties of Cadmium Telluride Thin Films

  • Hayder Mohammad Ajeel Ministry of Science and Technology-Materials Research Directorate
Keywords: CdTe thin film ;Nano Structural; AFM , Electrical and Effect of concentration

Abstract

Prepared of the CdTe thin films by thermal evaporation technique in the vacuum of about 3 × 10−3 torr. in two concentrations(x= 0.2 and x= 0.3) on glass and silicon substrates. In this study we present the effect of increased concentrations of 0.2 and 0.3 on the structural, optical and electrical properties of The CdTe thin films. The structural properties were study by X-ray diffraction (XRD) and XRF results showed that the films were polycrystalline, optical microscope examination and Atomic Force microscopy (AFM) average grain size (24.66 – 12.11 ) nm for (x= 0.2 and x= 0.3) respectively . The optical properties were characterized by UV–VIS spectroscopy and the electrical properties was study.

Published
2019-07-10
How to Cite
Ajeel, H. M. (2019). Study of Structural, Optical and Electrical Properties of Cadmium Telluride Thin Films. University of Thi-Qar Journal of Science, 4(4), 50-55. Retrieved from https://jsci.utq.edu.iq/index.php/main/article/view/665
Section
Articles