Preparation and Characterization of Titanium Dioxide (TiO ) Thin Films Prepared By Spin Coating Method 2

Abstract

Transparent semiconducting thin films of titanium dioxide (TiO

2
-
) were deposited on glass substrates by spincoating

technique and with thickness was in order of 150 ± 5 nm . The XRD analysis reveals that the films are
polycrystalline with an anatase crystal structure and a preferred grain orientation in the (101) direction. The optical
properties of the films were characterized by UV–visible spectrophotometry, which shows that the films are highly
transparent in the visible and near infrared , with an average value above (99 %), with energy gape (3.79 e.v ). The
dependence of the refractive index (n), extinction coefficient (k), and absorption coefficient (α) of the films on the
wavelength was investigated.